{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:47:33Z","timestamp":1780318053271,"version":"3.54.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/mim.2020.9062684","type":"journal-article","created":{"date-parts":[[2020,4,9]],"date-time":"2020-04-09T20:20:53Z","timestamp":1586463653000},"page":"21-29","source":"Crossref","is-referenced-by-count":4,"title":["I&M applications for educational purposes"],"prefix":"10.1109","volume":"23","author":[{"given":"Raul","family":"Lonel","sequence":"first","affiliation":[{"name":"Dept. of Meas. & Opt. Electron., Univ. Politeh. of Timisoara, Timisoara, Romania"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Septimiu","family":"Mischie","sequence":"additional","affiliation":[{"name":"Dept. of Meas. & Opt. Electron., Univ. Politeh. of Timisoara, Timisoara, Romania"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel","family":"Belega","sequence":"additional","affiliation":[{"name":"Dept. of Meas. & Opt. Electron., Univ. Politeh. of Timisoara, Timisoara, Romania"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liliana","family":"M\u00e2\u0163iu-Lovan","sequence":"additional","affiliation":[{"name":"Dept. of Meas. & Opt. Electron., Univ. Politeh. of Timisoara, Timisoara, Romania"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ciprian","family":"Dughir","sequence":"additional","affiliation":[{"name":"Fac. of Electron., Telecommun. & Informational Technol., Univ. Politeh. of Timisoara, Timisoara, Romania"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICComm.2018.8430155"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1981.1163506"},{"key":"ref12","first-page":"391","article-title":"A MATLAB graphical to evaluate the CC2650 sensor tag","author":"mischie","year":"0","journal-title":"Proc 22nd IMEKO TC4 Int Symp"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.08.006"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2011.5955225"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2187245"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2011.6111219"},{"key":"ref11","first-page":"487","article-title":"Indoor pedestrian navigation using mimiaturized low-cost MEMS inertial measurement units","author":"yuan","year":"0","journal-title":"Proc IEEE\/ION Position Location and Navigation Symp"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236777"},{"key":"ref10","article-title":"Takaya Flying Probe","year":"0","journal-title":"AlfaTest"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2469433"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2018.8515703"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2018.8515702"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.904546"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-76537-2"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2270926"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193699"},{"key":"ref8","first-page":"1380","article-title":"Combining ATE and flying probe in-circuit test strategies for load board verification and test","author":"seah","year":"0","journal-title":"Proc IEEE Instrum Meas Technol Conf (IMTC)"},{"key":"ref7","year":"0","journal-title":"XJTAG"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SSST.2006.1619101"},{"key":"ref4","first-page":"1","year":"2013","journal-title":"IEEE Std 1149 1-2013 (Revision of IEEE Std 1149 1-2001) - Redline 1149 1-2013"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2057235"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2013.6572946"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2014.6873728"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/9062670\/09062684.pdf?arnumber=9062684","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,16]],"date-time":"2023-05-16T18:55:51Z","timestamp":1684263351000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9062684\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":24,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mim.2020.9062684","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}