{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T14:36:17Z","timestamp":1777473377177,"version":"3.51.4"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100006366","name":"Ministry of Education, Brazil","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100006366","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2021,8]]},"DOI":"10.1109\/mim.2021.9491008","type":"journal-article","created":{"date-parts":[[2021,7,20]],"date-time":"2021-07-20T19:55:08Z","timestamp":1626810908000},"page":"63-68","source":"Crossref","is-referenced-by-count":13,"title":["Multi-Plasmonic Resonance Based Sensor for the Characterization of Optical Dispersion Using a D-Shaped Photonic Crystal Fiber"],"prefix":"10.1109","volume":"24","author":[{"given":"Markos P.","family":"Cardoso","sequence":"first","affiliation":[]},{"given":"Anderson O.","family":"Silva","sequence":"additional","affiliation":[]},{"given":"Amanda F.","family":"Romeiro","sequence":"additional","affiliation":[]},{"given":"M. Thereza R.","family":"Giraldi","sequence":"additional","affiliation":[]},{"given":"Joao C.W.A.","family":"Costa","sequence":"additional","affiliation":[]},{"given":"Jose L.","family":"Santos","sequence":"additional","affiliation":[]},{"given":"Jose M.","family":"Baptista","sequence":"additional","affiliation":[]},{"given":"Ariel","family":"Guerreiro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.11.113"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OL.43.000891"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2442335"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.yofte.2018.09.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.yofte.2019.03.013"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1017\/9781108333511"},{"key":"ref16","year":"0","journal-title":"Simulate real-world designs devices and processes with multiphysics software from COMSOL"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2721779"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.71.085416"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(98)00322-0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/bios8030080"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OE.20.021693"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.3273359"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2017.2755668"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2015.2467189"},{"key":"ref2","author":"homola","year":"2018","journal-title":"Surface Plasmon Polariton Based Sensors"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"87","DOI":"10.1088\/1464-4258\/8\/4\/S06","article-title":"Surface plasmon-polariton length scales: a route to subwavelength optics","volume":"8","author":"barnes","year":"2006","journal-title":"J Opt A Pure and Appl Phys"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s12596-020-00622-6"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/9487791\/09491008.pdf?arnumber=9491008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:49Z","timestamp":1696518709000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9491008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8]]},"references-count":18,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mim.2021.9491008","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,8]]}}}