{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T07:45:10Z","timestamp":1762069510885,"version":"build-2065373602"},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/mim.2022.9908270","type":"journal-article","created":{"date-parts":[[2022,10,3]],"date-time":"2022-10-03T20:29:25Z","timestamp":1664828965000},"page":"16-18","source":"Crossref","is-referenced-by-count":3,"title":["The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021"],"prefix":"10.1109","volume":"25","author":[{"given":"Luca","family":"De Vito","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John","family":"Jendzurski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergio","family":"Rapuano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"William B.","family":"Boyer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerome","family":"Blair","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicholas G.","family":"Paulter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"article-title":"IEEE Standard for Transitions, Pulses, and Related Waveforms","volume-title":"IEEE Std. 181\u20132011, Institute of Electrical and Electronics Engineers","year":"2011","key":"ref1"},{"article-title":"IEEE Standard for Digitizing Waveform Recorders","volume-title":"IEEE Std. 1057\u20132017, Institute of Electrical and Electronics Engineers","year":"2017","key":"ref2"},{"article-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","volume-title":"IEEE Std. 1241\u20132010, Institute of Electrical and Electronics Engineers","year":"2010","key":"ref3"},{"article-title":"IEEE Standard for Terminology and Test Methods of Digital- to-Analog Converter Devices","volume-title":"IEEE Std. 1658\u20132011, Institute of Electrical and Electronics Engineers","year":"2011","key":"ref4"},{"article-title":"IEEE Standard for Terminology and Test Methods for Circuit Probes","volume-title":"IEEE Std. 1696\u20132013, Institute of Electrical and Electronics Engineers","year":"2017","key":"ref5"},{"article-title":"IEEE Standard for Jitter and Phase Noise","volume-title":"IEEE Std. 2414\u20132020, Institute of Electrical and Electronic Engineers","year":"2017","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2020.9257054"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2021.9580778"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/9908262\/09908270.pdf?arnumber=9908270","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:00:24Z","timestamp":1705960824000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9908270\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":8,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/mim.2022.9908270","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"type":"print","value":"1094-6969"},{"type":"electronic","value":"1941-0123"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}