{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T00:08:01Z","timestamp":1705968481191},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/mim.2022.9908274","type":"journal-article","created":{"date-parts":[[2022,10,3]],"date-time":"2022-10-03T20:29:25Z","timestamp":1664828965000},"page":"5-9","source":"Crossref","is-referenced-by-count":0,"title":["IMS Technical Committee TC-3: Condition Monitoring and Fault Diagnosis Instrument"],"prefix":"10.1109","volume":"25","author":[{"given":"Weihua","family":"Li","sequence":"first","affiliation":[]},{"given":"Xuefeng","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108487"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s130607385"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD53520.2021.9670781"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD53520.2021.9670550"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD53520.2021.9670854"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMD50554.2020.9261641"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9129514"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/9908262\/09908274.pdf?arnumber=9908274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:22:19Z","timestamp":1705962139000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9908274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":8,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/mim.2022.9908274","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}