{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,8,22]],"date-time":"2023-08-22T05:00:47Z","timestamp":1692680447537},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1109\/mim.2023.10208255","type":"journal-article","created":{"date-parts":[[2023,8,4]],"date-time":"2023-08-04T17:24:34Z","timestamp":1691169874000},"page":"18-24","source":"Crossref","is-referenced-by-count":0,"title":["Improving High-Demand VDATS TPS Performance Through More Effective ATE Interface Design Using Example of AMR Application"],"prefix":"10.1109","volume":"26","author":[{"given":"Sylwester","family":"Sobolewski","sequence":"first","affiliation":[{"name":"Electronic Warfare and Avionics Division,Georgia,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"William Larry","family":"Adams","sequence":"additional","affiliation":[{"name":"USAF's Avionics Automated Test Equipment,Georgia,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joseph E.","family":"Eckersley","sequence":"additional","affiliation":[{"name":"Command, Control, Intelligence, Surveillance and Reconnaissance Division,Georgia,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ravi","family":"Sankar","sequence":"additional","affiliation":[{"name":"University of South Florida,Department of Electrical Engineering,Tampa,Florida,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","first-page":"152","article-title":"Modulation classification based on multifractal features","volume":"1","author":"he","year":"0","journal-title":"Proc Int Conf ITS Telecommun"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DYSPAN.2005.1542629"},{"key":"ref12","author":"creel","year":"2008","journal-title":"Depot technicians begin using automatic test station"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/BlackSeaCom.2016.7901550"},{"key":"ref4","first-page":"598","article-title":"Solving the U.S. Air Force's ATS proliferation problem—the VDATS solution","author":"adams","year":"2008","journal-title":"Proc IEEE Autotestcon"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MOMUC.1999.819467"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/26.837045"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2010.5613552"},{"key":"ref5","first-page":"1","article-title":"Recognition of modern modulated waveforms with applications to ABMS and VDATS TPS development","author":"sobolewski","year":"2022","journal-title":"Proc IEEE Autotestcon"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2009.5314002"},{"key":"ref2","article-title":"Life after JSTARS","author":"hudson","year":"2019","journal-title":"Air Force Magazine"},{"key":"ref1","article-title":"The Air Force is creating a system to manage the military's forces in war","author":"osborn","year":"2018","journal-title":"National Interest"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/10208247\/10208255.pdf?arnumber=10208255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,21]],"date-time":"2023-08-21T17:54:27Z","timestamp":1692640467000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10208255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8]]},"references-count":12,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mim.2023.10208255","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,8]]}}}