{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,3]],"date-time":"2025-06-03T06:05:32Z","timestamp":1748930732908},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2024,2]]},"DOI":"10.1109\/mim.2024.10423663","type":"journal-article","created":{"date-parts":[[2024,2,7]],"date-time":"2024-02-07T18:48:56Z","timestamp":1707331736000},"page":"26-30","source":"Crossref","is-referenced-by-count":3,"title":["Education in I&M: New Insights in Remote Teaching and Learning of Instrumentation and Measurement: The iHomeX Remote Lab Project"],"prefix":"10.1109","volume":"27","author":[{"given":"Sabrina","family":"Grassini","sequence":"first","affiliation":[{"name":"Applied Physical Chemistry, Politecnico di Torino,Department of Applied Science and Technology,Italy"}]},{"given":"Luca","family":"Lombardo","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Department of Electronics and Telecommunications,Turin,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806504"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0263-2241(88)90003-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328216"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/imtc.2004.1351267"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.880309"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2004.1351269"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2019.8716275"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.899995"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.843077"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2786740"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/10423653\/10423663.pdf?arnumber=10423663","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,12]],"date-time":"2024-02-12T19:20:05Z","timestamp":1707765605000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10423663\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2]]},"references-count":10,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mim.2024.10423663","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,2]]}}}