{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T10:10:23Z","timestamp":1767262223946},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/mim.2024.10473014","type":"journal-article","created":{"date-parts":[[2024,3,18]],"date-time":"2024-03-18T19:17:37Z","timestamp":1710789457000},"page":"15-22","source":"Crossref","is-referenced-by-count":2,"title":["Development of an Energy-Efficient and Highly Sensitive Thermal Microsensor for Measuring Flow Rates of Fluids"],"prefix":"10.1109","volume":"27","author":[{"given":"Diego Fernando","family":"Valencia-Grisales","sequence":"first","affiliation":[{"name":"National Institute of Astrophysics, Optics and Electronics (INAOE),Puebla,Mexico"}]},{"given":"Claudia","family":"Reyes-Betanzo","sequence":"additional","affiliation":[{"name":"National Institute for Astrophysics, Optics and Electronics (INAOE),Electronics Department,Puebla,Mexico"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0924-4247(95)01014-r"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s151229881"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2019.2893151"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2011.2179014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(02)00034-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2011.6127204"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-008-0741-x"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2016.2596282"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(97)01529-X"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10854-021-06570-6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2307\/2004575"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/memsys.2016.7421590"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/0924-4247(93)80008-5"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4977998"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/10472980\/10473014.pdf?arnumber=10473014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,11]],"date-time":"2024-04-11T04:48:52Z","timestamp":1712810932000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10473014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":14,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mim.2024.10473014","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}