{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T00:25:45Z","timestamp":1717028745944},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/mim.2024.10540398","type":"journal-article","created":{"date-parts":[[2024,5,28]],"date-time":"2024-05-28T18:09:57Z","timestamp":1716919797000},"page":"37-39","source":"Crossref","is-referenced-by-count":0,"title":["Diversity and Inclusion in I&M: IEEE Instrumentation and Measurement Mentorship Program"],"prefix":"10.1109","volume":"27","author":[{"given":"Judy","family":"Amanor-Boadu","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref1","volume-title":"Homer: The Odyssey, translated by Lattimore R. New York","year":"1965"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/BF03341901"},{"key":"ref3","article-title":"Can you guess who mentored Mark Zuckerberg?","author":"Mentii","journal-title":"The Chronicle of Evidence-Based Mentoring"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/abc.227"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/ajcp.12504"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FIE.2018.8659253"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICL.2015.7318210"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1093\/femspd\/ftac019"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.acra.2022.08.014"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/10540378\/10540398.pdf?arnumber=10540398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T17:30:19Z","timestamp":1717003819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10540398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":9,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mim.2024.10540398","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}