{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,13]],"date-time":"2025-11-13T12:46:59Z","timestamp":1763038019138},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100008963","name":"Guangdong University of Petrochemical Technology","doi-asserted-by":"publisher","award":["702-519210,702-519244"],"award-info":[{"award-number":["702-519210,702-519244"]}],"id":[{"id":"10.13039\/100008963","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/mim.2024.10623159","type":"journal-article","created":{"date-parts":[[2024,8,5]],"date-time":"2024-08-05T17:49:37Z","timestamp":1722880177000},"page":"11-13","source":"Crossref","is-referenced-by-count":1,"title":["Investigation on Errors of the Approximation Equation of Correction Factor G<sub>7<\/sub> for Four-Point Probe Resistivity Measurement"],"prefix":"10.1109","volume":"27","author":[{"given":"Bing-Yuh","family":"Lu","sequence":"first","affiliation":[]},{"given":"Pao-An","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Linshu","family":"Zheng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1954.274680"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/36\/8\/082001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(68)90060-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/20\/12\/003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1958.tb03883.x"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-019-07711-8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s13204-015-0464-0"}],"container-title":["IEEE Instrumentation &amp; Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/10622083\/10623159.pdf?arnumber=10623159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T08:59:47Z","timestamp":1722934787000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10623159\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":7,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mim.2024.10623159","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"type":"print","value":"1094-6969"},{"type":"electronic","value":"1941-0123"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}