{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:18:14Z","timestamp":1740133094016,"version":"3.37.3"},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006758","name":"Bureau of Safety and Environmental Enforcement","doi-asserted-by":"publisher","award":["140E0118C0003"],"award-info":[{"award-number":["140E0118C0003"]}],"id":[{"id":"10.13039\/100006758","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/mim.2024.10743132","type":"journal-article","created":{"date-parts":[[2024,11,5]],"date-time":"2024-11-05T18:32:54Z","timestamp":1730831574000},"page":"11-15","source":"Crossref","is-referenced-by-count":0,"title":["Virtual Testing Methods of Cyber-Physical Systems: A Framework for Testing Instrumentation and Measurement Systems"],"prefix":"10.1109","volume":"27","author":[{"given":"Mahdi","family":"Saleh","sequence":"first","affiliation":[]},{"given":"Imad H.","family":"Elhajj","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Asmar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2009.81"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00766-021-00359-z"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-39742-4_12"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786818"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3106237.3117770"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2866745"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SENSORS47125.2020.9278814"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8826990"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3212108"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/10743124\/10743132.pdf?arnumber=10743132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T13:42:08Z","timestamp":1732714928000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10743132\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":9,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/mim.2024.10743132","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"type":"print","value":"1094-6969"},{"type":"electronic","value":"1941-0123"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}