{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,3]],"date-time":"2025-09-03T00:11:50Z","timestamp":1756858310856,"version":"3.44.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/mim.2025.11146569","type":"journal-article","created":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:31:22Z","timestamp":1756755082000},"page":"29-37","source":"Crossref","is-referenced-by-count":0,"title":["Developments in Measurement Electronics for Indian Plasma Diagnostic Sensor Probes"],"prefix":"10.1109","volume":"28","author":[{"given":"Sreehari B.","family":"Nair","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anoop Chandrika","family":"Sreekantan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudharshan","family":"Kaarthik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Umesh R.","family":"Kadhane","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V. S.","family":"Sooraj","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2008.2002032"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.4937622"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2015.2399373"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2017.2700211"},{"key":"ref5","article-title":"Design, fabrication, and data analysis of a high-temperature single Langmuir probe","volume-title":"Princeton University","author":"Hollingsworth","year":"2016"},{"key":"ref6","first-page":"5","article-title":"RPA aeronomy experiment onboard the Indian satellite SROSS-C2 - Some important aspects of the payload and satellite","volume":"32","author":"Garg","year":"2002","journal-title":"Indian J. Radio and Space Physics"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.18520\/cs\/v118\/i3\/383-391"},{"volume-title":"Indian Institute of Space Science & Technology (IIST)","key":"ref8","article-title":"Advanced Retarding Potential Analyser for Ionospheric Studies"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3094830"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1148048"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1150653"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2803339"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.905657"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/19.836299"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3124837"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/INDICON56171.2022.10039749"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3326508"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace57412.2023.10190012"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3241064"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3542147"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/11146566\/11146569.pdf?arnumber=11146569","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T17:31:32Z","timestamp":1756834292000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11146569\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":20,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mim.2025.11146569","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"type":"print","value":"1094-6969"},{"type":"electronic","value":"1941-0123"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}