{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T18:45:41Z","timestamp":1762281941570,"version":"build-2065373602"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/mim.2025.11224698","type":"journal-article","created":{"date-parts":[[2025,11,3]],"date-time":"2025-11-03T18:45:22Z","timestamp":1762195522000},"page":"3-10","source":"Crossref","is-referenced-by-count":0,"title":["Smart Meter-Based System for Real-Time Fault Diagnosis of Inter-Turn Short Circuits in Induction Motors Leveraging Attention-Enhanced ResNet"],"prefix":"10.1109","volume":"28","author":[{"given":"Kun","family":"Xia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziyu","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jingxia","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME56728.2022.9988074"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2024.111683"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3172751"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3243297"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2021.107234"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2939678"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3067915"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3014006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DSPA57594.2023.10113403"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912763"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3213598"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2020.9234764"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2019.8917900"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3210220"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CECIT58139.2022.00042"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/11224691\/11224698.pdf?arnumber=11224698","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T18:36:39Z","timestamp":1762281399000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11224698\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":15,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/mim.2025.11224698","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"type":"print","value":"1094-6969"},{"type":"electronic","value":"1941-0123"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}