{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T20:17:59Z","timestamp":1792786679308,"version":"4.5.0"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2026,9,1]],"date-time":"2026-09-01T00:00:00Z","timestamp":1788220800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/tdmrep.html"}],"funder":[{"name":"National Natural Science Foundation of China","award":["52204130"],"award-info":[{"award-number":["52204130"]}],"id":[{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2026,9]]},"DOI":"10.1109\/mim.2026.11224835","type":"journal-article","created":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T19:53:34Z","timestamp":1776369214000},"page":"13-21","source":"Crossref","is-referenced-by-count":0,"title":["Development of an Elevator Door Lock Engagement Depth Detection System: Design and Application"],"prefix":"10.1109","volume":"29","author":[{"given":"Hai-Jian","family":"Wang","sequence":"first","affiliation":[{"name":"Guilin University of Electronic Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zi-Liang","family":"Hu","sequence":"additional","affiliation":[{"name":"Xidian University"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin-Yu","family":"Xiong","sequence":"additional","affiliation":[{"name":"Guilin University of Electronic Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun-Feng","family":"Li","sequence":"additional","affiliation":[{"name":"Guilin University of Electronic Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guan-Qiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Guilin University of Electronic Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"issue":"14","key":"ref1","first-page":"53","article-title":"Common issues and analysis in elevator door inspection","volume":"31","author":"Chen","year":"2020","journal-title":"China Elevator"},{"issue":"21","key":"ref2","article-title":"Importance of elevator door system parameters on elevator safety operation","author":"Yang","year":"2013","journal-title":"Science & Technology Innovation Herald"},{"issue":"5","key":"ref3","first-page":"144","article-title":"A brief discussion on the inspection of elevator door lock devices","author":"Xian","year":"2018","journal-title":"China New Technology and New Products"},{"issue":"6","key":"ref4","first-page":"38","article-title":"Discussion on inspection methods for the engagement status of elevator door locking components","volume":"35","author":"Chen","year":"2019","journal-title":"China Special Equipment Safety"},{"issue":"2","key":"ref5","first-page":"22","article-title":"Inspection methods for the engagement depth of elevator door locking components","volume":"27","author":"Chang","year":"2011","journal-title":"China Special Equipment Safety"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2025.10982116"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2290\/1\/012061"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2719630"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3141074"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.5302\/J.ICROS.2012.18.6.601"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/11664544\/11482785.pdf?arnumber=11482785","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T19:08:34Z","timestamp":1791918514000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11482785\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9]]},"references-count":10,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mim.2026.11224835","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9]]}}}