{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T22:12:18Z","timestamp":1771279938435,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/mim.2026.11395444","type":"journal-article","created":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T20:50:30Z","timestamp":1771015830000},"page":"30-40","source":"Crossref","is-referenced-by-count":0,"title":["Review of Phasor Estimation Algorithms and Applications of Phasor Measurement Units"],"prefix":"10.1109","volume":"29","author":[{"given":"Samah A.","family":"Mohamed","sequence":"first","affiliation":[{"name":"Fayoum University, National Institute of Standards"}]},{"given":"Hala M. Abdel","family":"Mageed","sequence":"additional","affiliation":[{"name":"National Institute of Standards"}]},{"given":"Osama M.","family":"Arafa","sequence":"additional","affiliation":[{"name":"Electronics Research Institute"}]},{"given":"Mohamed H.","family":"Merzban","sequence":"additional","affiliation":[{"name":"Fayoum University"}]},{"given":"Magdy B.","family":"Eteiba","sequence":"additional","affiliation":[{"name":"Fayoum University"}]},{"given":"Amr A.","family":"Saleh","sequence":"additional","affiliation":[{"name":"Fayoum University, Coventry University"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.24425\/bpasts.2022.143826"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3146732"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2018.2859323"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2024.103559"},{"key":"ref5","article-title":"Measuring Relays and Protection Equipment-Part 118\u20131: Synchrophasor for Power Systems-Measurements","year":"2018","journal-title":"IEEE\/IEC International Standard"},{"key":"ref6","article-title":"IEEE Standard for Synchrophasor Measurements for Power Systems","year":"2011","journal-title":"IEEE Std C37.118.1\u20132011 (Revision of IEEE Std C37.118-2005)"},{"key":"ref7","article-title":"IEEE Standard for Synchrophasor Measurements for Power Systems-Amendment 1: Modification of Selected Performance Requirements","year":"2014","journal-title":"IEEE Std C37.118.1a-2014 (Amendment to IEEE Std C37.118.1\u20132011)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/app11052261"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2020.2965195"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/icasert.2019.8934584"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.11591\/ijpeds.v10.i2.pp1034-1048"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jestch.2014.07.005"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1186\/s13638-019-1492-3"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2020.103102"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.18178\/IJIEE.2016.6.6.649"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICESA.2015.7503363"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CISTEM.2018.8613613"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2199197"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236777"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2450295"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2030921"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2238256"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/SPACES.2015.7058244"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/en12234552"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/en14071953"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2020.106196"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.5815\/ijieeb.2015.05.04"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2014.2356797"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/PMAPS47429.2020.9183480"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/5289\/11395435\/11395444.pdf?arnumber=11395444","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T21:07:32Z","timestamp":1771276052000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11395444\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":29,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mim.2026.11395444","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}