{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:49:08Z","timestamp":1729651748713,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/mixdes.2016.7529754","type":"proceedings-article","created":{"date-parts":[[2016,8,4]],"date-time":"2016-08-04T20:27:52Z","timestamp":1470342472000},"page":"310-315","source":"Crossref","is-referenced-by-count":0,"title":["Analysis and 2D analytical modeling of III\u2013V Schottky barrier Double-Gate MOSFETs"],"prefix":"10.1109","author":[{"given":"Mike","family":"Schwarz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Kloes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2016.2522981"},{"year":"2016","key":"ref11","article-title":"Electronic archive, New Semiconductor Materials"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(96)00122-0"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.11.023"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2013.01.004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2014.04.038"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/BF01397171"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/BF01451751"},{"key":"ref18","first-page":"24","article-title":"La m&#x00E9;canique ondulatoire de Schr&#x00F6;dinger; &#x201C;une M&#x00E9;thode G&#x00E9;n&#x00E9;rale de resolution durchschnittliche N&#x00E4;herungswerte successives","volume":"138","author":"brillouin","year":"1926","journal-title":"Comptes Rendus (Paris)"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/16.121690"},{"key":"ref4","first-page":"69","article-title":"Limits of Sepcific Contact Resistivity to Si, Ge and III-V Semiconductors Using Interfacial Layers","author":"shine","year":"2013","journal-title":"SISPAD"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.2410241"},{"article-title":"Physics of Semiconductor Devices","year":"2007","author":"sze","key":"ref6"},{"key":"ref5","article-title":"Schottky-barrier height modulation of metal\/ln0.53 Ga0.47As interfaces by insertion of atomic-layer deposited ultrathin Al2O3","author":"wang","year":"2011","journal-title":"Nanoscience and Nanotechnology"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.917817"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796843"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.871842"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419016"},{"key":"ref1","article-title":"Intel 22nm 3-D Tri-Gate Transistor Technology","author":"bruner","year":"2011","journal-title":"News release and press materials (Intel)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.1654509"},{"journal-title":"Synopsys Inc c-2009 06 Edition","year":"2009","author":"sentaurus","key":"ref22"},{"key":"ref21","article-title":"Theory of Boundary Layer of Crystal Rectifiers","author":"bethe","year":"1942","journal-title":"MIT Radiation Lab Rep"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.4236\/jmp.2011.23018"},{"article-title":"Lectures Electrons and Holes in Semiconductors","year":"2016","author":"hu","key":"ref23"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.110607"}],"event":{"name":"2016 MIXDES - 23rd International Conference \"Mixed Design of Integrated Circuits and Systems\"","start":{"date-parts":[[2016,6,23]]},"location":"Lodz, Poland","end":{"date-parts":[[2016,6,25]]}},"container-title":["2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7523589\/7529685\/07529754.pdf?arnumber=7529754","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T02:31:01Z","timestamp":1474857061000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7529754\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/mixdes.2016.7529754","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}