{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T05:42:09Z","timestamp":1760074929486,"version":"build-2065373602"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T00:00:00Z","timestamp":1757289600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T00:00:00Z","timestamp":1757289600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100005235","name":"Institute for Advanced Study","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100005235","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,8]]},"DOI":"10.1109\/mlcad65511.2025.11189220","type":"proceedings-article","created":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T17:51:22Z","timestamp":1760032282000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Improving Last-Mile Coverage in Functional Verification"],"prefix":"10.1109","author":[{"given":"Chengjia","family":"Liu","sequence":"first","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jnana Preeti","family":"Parlapalli","sequence":"additional","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David Kebo","family":"Houngninou","sequence":"additional","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Quinn","sequence":"additional","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aakash","family":"Tyagi","sequence":"additional","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiang","family":"Hu","sequence":"additional","affiliation":[{"name":"Texas A&M University,College Station,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Evaluating code coverage of assertions by static analysis of rtl","volume-title":"Coordinated Science Laboratory Report no. UILU-ENG-11-2209, CRHC-11-07","author":"Athavale","year":"2011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-25556-7_6"},{"journal-title":"Joules Integrated Metrics Center (IMC)","year":"2023","key":"ref3"},{"journal-title":"Xcelium Logic Simulator","year":"2023","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/INDICON63790.2024.10958410"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2012.6418243"},{"journal-title":"Verible: Systemverilog developer tools","year":"2025","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-020-01348-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775907"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.70731"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD61181.2024.10745410"},{"key":"ref12","first-page":"2","article-title":"Machine learning-guided stimulus generation for functional verification","volume-title":"Proceedings of the Design and Verification Conference (DVCON-USA), Virtual Conference","author":"Gogri"},{"journal-title":"Improved training of wasserstein gans","year":"2017","author":"Gulrajani","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10212688"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2013.6864032"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID60093.2024.00124"},{"volume-title":"OpenTitan: Open Source Silicon Root of Trust","year":"2023","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/AITest55621.2022.00012"},{"key":"ref19","article-title":"Adaptive test generation for fast functional coverage closure","author":"Nazi","year":"2022","journal-title":"DVCON USA"},{"journal-title":"Opentitan aes ip specification","year":"2025","key":"ref20"},{"journal-title":"Opentitan entropy source ip specification","year":"2025","key":"ref21"},{"volume-title":"Functional verification coverage measurement and analysis","year":"2007","author":"Piziali","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3384544.3384547"},{"article-title":"Conditional gan for timeseries generation","year":"2020","author":"Smith","key":"ref24"},{"article-title":"Optimizing random test constraints using machine learning algorithms","volume-title":"Proceedings of the design and verification conference and exhibition US (DVCon)","author":"Sokorac","key":"ref25"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/RSP64122.2024.10870908"},{"issue":"4","key":"ref27","first-page":"533","article-title":"An efficient coverage driven functional verification system based on genetic algorithm","volume":"81","author":"Subedha","year":"2012","journal-title":"European Journal of Scientific Research"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3661308"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP58684.2023.00037"}],"event":{"name":"2025 ACM\/IEEE 7th Symposium on Machine Learning for CAD (MLCAD)","start":{"date-parts":[[2025,9,8]]},"location":"Santa Cruz, CA, USA","end":{"date-parts":[[2025,9,10]]}},"container-title":["2025 ACM\/IEEE 7th Symposium on Machine Learning for CAD (MLCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11189084\/11189054\/11189220.pdf?arnumber=11189220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T05:12:16Z","timestamp":1760073136000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11189220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,8]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/mlcad65511.2025.11189220","relation":{},"subject":[],"published":{"date-parts":[[2025,9,8]]}}}