{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T05:40:51Z","timestamp":1760074851300,"version":"build-2065373602"},"reference-count":39,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T00:00:00Z","timestamp":1757289600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T00:00:00Z","timestamp":1757289600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,8]]},"DOI":"10.1109\/mlcad65511.2025.11189222","type":"proceedings-article","created":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T17:51:22Z","timestamp":1760032282000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["ASPEN: LLM-Guided E-Graph Rewriting for RTL Datapath Optimization"],"prefix":"10.1109","author":[{"given":"Niansong","family":"Zhang","sequence":"first","affiliation":[{"name":"Cornell University"}]},{"given":"Chenhui","family":"Deng","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation"}]},{"given":"Johannes Maximilian","family":"Kuehn","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation"}]},{"given":"Chia-Tung","family":"Ho","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation"}]},{"given":"Cunxi","family":"Yu","sequence":"additional","affiliation":[{"name":"University of Maryland,College Park"}]},{"given":"Zhiru","family":"Zhang","sequence":"additional","affiliation":[{"name":"Cornell University"}]},{"given":"Haoxing","family":"Ren","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586094"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247948"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3410154"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323812"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473904"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137086"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3643681"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LAD62341.2024.10691788"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3657353"},{"article-title":"Au-tochip: Automating hdl generation using llm feedback","year":"2023","author":"Thakur","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968667"},{"article-title":"A heuristic approach to two-level boolean minimization derived from karnaugh mapping","year":"2020","author":"Childerhose","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3676536.3676762"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3434304"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3591239"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.14778\/3407790.3407799"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3445814.3446707"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DAC63849.2025.11133110"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3656246"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DAC63849.2025.11132728"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3620665.3640392"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM53951.2022.9786123"},{"article-title":"Hec: Equivalence verification checking for code transformation via equality saturation","volume-title":"USENIX Annual Technical Conference (ATC)","author":"Yin","key":"ref23"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247797"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3483096"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3669940.3707262"},{"article-title":"Towards llm-powered verilog rtl assistant: Self-verification and self-correction","year":"2024","author":"Huang","key":"ref27"},{"article-title":"Make every move count: Llm-based high-quality rtl code generation using mcts","year":"2024","author":"DeLorenzo","key":"ref28"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3676536.3697118"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICLAD65226.2025.00020"},{"article-title":"Vericoder: Enhancing llm-based rtl code generation through functional correctness validation","year":"2025","author":"Wei","key":"ref31"},{"article-title":"Zero-shot rtl code generation with attention sink augmented large language models","year":"2024","author":"Sandal","key":"ref32"},{"article-title":"Symrtlo: Enhancing rtl code optimization with llms and neuron-inspired symbolic reasoning","year":"2025","author":"Wang","key":"ref33"},{"article-title":"Eda-aware rtl generation with large language models","year":"2024","author":"Sami","key":"ref34"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ATS64447.2024.10915239"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/dac63849.2025.11133191"},{"article-title":"Uvllm: An automated universal rtl verification framework using llms","year":"2024","author":"Hu","key":"ref37"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ATS64447.2024.10915277"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"}],"event":{"name":"2025 ACM\/IEEE 7th Symposium on Machine Learning for CAD (MLCAD)","start":{"date-parts":[[2025,9,8]]},"location":"Santa Cruz, CA, USA","end":{"date-parts":[[2025,9,10]]}},"container-title":["2025 ACM\/IEEE 7th Symposium on Machine Learning for CAD (MLCAD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11189084\/11189054\/11189222.pdf?arnumber=11189222","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T05:13:42Z","timestamp":1760073222000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11189222\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,8]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/mlcad65511.2025.11189222","relation":{},"subject":[],"published":{"date-parts":[[2025,9,8]]}}}