{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:03:35Z","timestamp":1742097815515,"version":"3.38.0"},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2002,9]]},"DOI":"10.1109\/mm.2002.1044301","type":"journal-article","created":{"date-parts":[[2003,1,3]],"date-time":"2003-01-03T17:55:00Z","timestamp":1041616500000},"page":"69-81","source":"Crossref","is-referenced-by-count":13,"title":["A hierarchical test methodology for systems on chip"],"prefix":"10.1109","volume":"22","author":[{"family":"Jin-Fu Li","sequence":"first","affiliation":[]},{"family":"Hsin-Jung Huang","sequence":"additional","affiliation":[]},{"family":"Jeng-Bin Chen","sequence":"additional","affiliation":[]},{"family":"Chih-Pin Su","sequence":"additional","affiliation":[]},{"family":"Cheng-Wen Wu","sequence":"additional","affiliation":[]},{"family":"Chuang Cheng","sequence":"additional","affiliation":[]},{"family":"Shao-I Chen","sequence":"additional","affiliation":[]},{"family":"Chi-Yi Hwang","sequence":"additional","affiliation":[]},{"family":"Hsiao-Ping Lin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/2.769444"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639596"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670842"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893633"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2002.1004585"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.875306"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894302"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016557927479"}],"container-title":["IEEE Micro"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/40\/22379\/01044301.pdf?arnumber=1044301","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:18:01Z","timestamp":1742015881000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1044301\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,9]]},"references-count":9,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2002,9]]}},"URL":"https:\/\/doi.org\/10.1109\/mm.2002.1044301","relation":{},"ISSN":["0272-1732"],"issn-type":[{"type":"print","value":"0272-1732"}],"subject":[],"published":{"date-parts":[[2002,9]]}}}