{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,13]],"date-time":"2026-08-13T16:23:58Z","timestamp":1786638238892,"version":"3.56.0"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2003,7,1]],"date-time":"2003-07-01T00:00:00Z","timestamp":1057017600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2003,7]]},"DOI":"10.1109\/mm.2003.1225959","type":"journal-article","created":{"date-parts":[[2003,9,11]],"date-time":"2003-09-11T19:12:07Z","timestamp":1063307527000},"page":"14-19","source":"Crossref","is-referenced-by-count":468,"title":["Trends and challenges in VLSI circuit reliability"],"prefix":"10.1109","volume":"23","author":[{"given":"C.","family":"Constantinescu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2002.805785"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946459"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2001.934953"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/dsn.2002.1028924"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/6.825662"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173499"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.1998.723144"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2000.852667"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1994.331932"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173502"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EURMIC.1998.711840"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/40.877951"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1147\/rd.435.0671"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2002.1003565"}],"container-title":["IEEE Micro"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/40\/27520\/01225959.pdf?arnumber=1225959","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:43:28Z","timestamp":1742100208000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1225959\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,7]]},"references-count":14,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2003,7]]}},"URL":"https:\/\/doi.org\/10.1109\/mm.2003.1225959","relation":{},"ISSN":["0272-1732"],"issn-type":[{"value":"0272-1732","type":"print"}],"subject":[],"published":{"date-parts":[[2003,7]]}}}