{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T03:25:00Z","timestamp":1778037900586,"version":"3.51.4"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,11,1]],"date-time":"2017-11-01T00:00:00Z","timestamp":1509494400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/mm.2017.4241347","type":"journal-article","created":{"date-parts":[[2017,11,23]],"date-time":"2017-11-23T19:10:44Z","timestamp":1511464244000},"page":"20-29","source":"Crossref","is-referenced-by-count":271,"title":["CMOS Scaling Trends and Beyond"],"prefix":"10.1109","volume":"37","author":[{"given":"Mark T.","family":"Bohr","sequence":"first","affiliation":[]},{"given":"Ian A.","family":"Young","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417888"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11051-007-9305-8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2013.2252317"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2015.2418033"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409816"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147115"},{"key":"ref16","article-title":"Principals and Trends in Quantum Nano-Electronics and Nano-Magnetics for Beyond CMOS Computing","author":"young","year":"0","journal-title":"Proc European Solid-State Device Research Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269442"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1974.1050511"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242496"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418914"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"713","DOI":"10.1109\/TED.2015.2388708","article-title":"Comprehensive Performance Benchmarking of III-V and Si nMOSFETs (Gate Length = 13 nm) Considering Supply Voltage and OFF-Current","volume":"62","author":"kim","year":"2015","journal-title":"IEEE Trans Electron Devices"},{"key":"ref7","first-page":"71","article-title":"A 14nm Logic Technology Featuring 2nd Generation FinFET Transistors, Air-Gapped Interconnects, Self-Aligned Double Patterning and a 0.0588um2 SRAM Cell Size","author":"natarajan","year":"0","journal-title":"Tech Digest IEEE Int l Electron Devices Meeting"},{"key":"ref2","first-page":"11","article-title":"Progress in Digital Integrated Electronics","author":"moore","year":"0","journal-title":"Tech Digest IEEE Int l Electron Devices Meeting"},{"key":"ref1","first-page":"114","article-title":"Cramming More Components onto Integrated Circuits","volume":"38","author":"moore","year":"1965","journal-title":"Electronics"},{"key":"ref9","first-page":"33","article-title":"Energy Efficiency Comparison of Nanowire Heterojunction TFET and Si MOSFET at Lg = 13 nm, Including P-TFET and Variation Considerations","author":"avci","year":"0","journal-title":"Tech Digest IEEE Int l Electron Devices Meeting"}],"container-title":["IEEE Micro"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/40\/8119639\/08119702.pdf?arnumber=8119702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:35:16Z","timestamp":1642005316000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8119702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":16,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mm.2017.4241347","relation":{},"ISSN":["0272-1732"],"issn-type":[{"value":"0272-1732","type":"print"}],"subject":[],"published":{"date-parts":[[2017,11]]}}}