{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:22:32Z","timestamp":1652196152184},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2021,1,1]]},"DOI":"10.1109\/mm.2020.3046118","type":"journal-article","created":{"date-parts":[[2021,1,27]],"date-time":"2021-01-27T20:43:09Z","timestamp":1611780189000},"page":"6-7","source":"Crossref","is-referenced-by-count":0,"title":["Hot Interconnects 27"],"prefix":"10.1109","volume":"41","author":[{"given":"Ryan E.","family":"Grant","sequence":"first","affiliation":[{"name":"Center for Computational Research, Sandia National Laboratories, Albuquerque, NM, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manjunath Gorentla","family":"Venkata","sequence":"additional","affiliation":[{"name":"NVIDIA Corporation, Sunnyvale, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","container-title":["IEEE Micro"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/40\/9336732\/09336754.pdf?arnumber=9336754","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:50:43Z","timestamp":1652194243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9336754\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,1,1]]},"references-count":0,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mm.2020.3046118","relation":{},"ISSN":["0272-1732","1937-4143"],"issn-type":[{"value":"0272-1732","type":"print"},{"value":"1937-4143","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,1,1]]}}}