{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,8]],"date-time":"2025-05-08T18:10:10Z","timestamp":1746727810698,"version":"3.40.5"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/USG.html"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1109\/mm.2025.3555461","type":"journal-article","created":{"date-parts":[[2025,5,6]],"date-time":"2025-05-06T17:03:11Z","timestamp":1746550991000},"page":"6-7","source":"Crossref","is-referenced-by-count":0,"title":["Special Issue on Hot Interconnects 31"],"prefix":"10.1109","volume":"45","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4955-2984","authenticated-orcid":false,"given":"Whit","family":"Schonbein","sequence":"first","affiliation":[{"name":"Sandia National Laboratories, Albuquerque, NM, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2041-7877","authenticated-orcid":false,"given":"Joseph","family":"Schuchart","sequence":"additional","affiliation":[{"name":"Stony Brook University, Stony Brook, NY, USA"}]}],"member":"263","container-title":["IEEE Micro"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/40\/10989057\/10989261.pdf?arnumber=10989261","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,8]],"date-time":"2025-05-08T17:38:39Z","timestamp":1746725919000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10989261\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3]]},"references-count":0,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mm.2025.3555461","relation":{},"ISSN":["0272-1732","1937-4143"],"issn-type":[{"type":"print","value":"0272-1732"},{"type":"electronic","value":"1937-4143"}],"subject":[],"published":{"date-parts":[[2025,3]]}}}