{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T13:05:19Z","timestamp":1773320719582,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Micro"],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/mm.2025.3643799","type":"journal-article","created":{"date-parts":[[2025,12,15]],"date-time":"2025-12-15T18:38:33Z","timestamp":1765823913000},"page":"10-18","source":"Crossref","is-referenced-by-count":0,"title":["Silent Data Corruption: Optimal Mitigation Strategies for Data Center Computing"],"prefix":"10.1109","volume":"46","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-1248-0721","authenticated-orcid":false,"given":"Nirmal","family":"Saxena","sequence":"first","affiliation":[{"name":"Nvidia, Santa Clara, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2612-2001","authenticated-orcid":false,"given":"Saurabh","family":"Hukerikar","sequence":"additional","affiliation":[{"name":"Nvidia, Santa Clara, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8346-7981","authenticated-orcid":false,"given":"Siva","family":"Hari","sequence":"additional","affiliation":[{"name":"Nvidia, Santa Clara, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/iolts59296.2023.10224872"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/dsn.2008.4630077"},{"key":"ref5","article-title":"Performing RAS in todays mission critical systems","volume-title":"Proc. IEEE Int. Test Conf. Panel","author":"Saxena","year":"2022"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/itc44170.2019.9000150"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/dsn-s60304.2024.00036"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/itc50671.2022.00065"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/itc50671.2022.00040"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/hpca61900.2025.00012"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/361147.361115"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2004.11.016"},{"key":"ref13","article-title":"Optimal checkpoint interval with availability as an objective function","author":"Saxena","year":"2024"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/dft63277.2024.10753526"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ojcs.2024.3400696"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/issre52982.2021.00025"}],"container-title":["IEEE Micro"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/40\/11429112\/11301038.pdf?arnumber=11301038","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T19:37:18Z","timestamp":1773257838000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11301038\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":16,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mm.2025.3643799","relation":{},"ISSN":["0272-1732","1937-4143"],"issn-type":[{"value":"0272-1732","type":"print"},{"value":"1937-4143","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}