{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:44:36Z","timestamp":1729651476751,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/mocast.2017.7937615","type":"proceedings-article","created":{"date-parts":[[2017,6,1]],"date-time":"2017-06-01T20:22:12Z","timestamp":1496348532000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A time-aware code execution continuous monitoring for safety-critical applications"],"prefix":"10.1109","author":[{"given":"Vasileios","family":"Chioktour","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Athanasios","family":"Kakarountas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1997.614107"},{"key":"ref11","first-page":"2","article-title":"Signature Analysis: A new digital field service method","author":"frohwerk","year":"1977","journal-title":"Hewlett-Packard J"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.55193"},{"key":"ref13","first-page":"914","article-title":"Continuous signature monitoring: efficient concurrent-detection of processor control errors","author":"wilken","year":"1998","journal-title":"Test Conference 1988 Proceedings New Frontiers in Testing International"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001152"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2456014"},{"key":"ref16","article-title":"Protecting the Control Flow of Embedded Processors against Fault Attacks","author":"werner","year":"2015","journal-title":"Proc of Smart Card Research and Advanced Applications 14th International Conference CARDIS 2015"},{"journal-title":"Principles for Computers in Safety-related Systems","year":"1990","key":"ref17"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"489","DOI":"10.1109\/T-C.1975.224251","article-title":"an advanced fault isolation system for digital logic","volume":"c 24","author":"benowitz","year":"1975","journal-title":"IEEE Transactions on Computers"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"123","DOI":"10.1109\/92.555992","article-title":"Power Analysis and Minimization Techniques for Embedded DSP Software","volume":"5","author":"lee","year":"1997","journal-title":"IEEE Trans on VLSI Systems"},{"key":"ref4","article-title":"Low power design in deep submicron electronics","author":"nebel","year":"2013","journal-title":"Springer Science & Business Media"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1166\/jno.2017.2001"},{"journal-title":"Low Power Design Methodologies","year":"1995","author":"rabaey","key":"ref6"},{"journal-title":"Probabilistic Logics and the Synthesis of Reliable Organisms from Unreliable Components","year":"1956","author":"von neumann","key":"ref5"},{"journal-title":"Intel Intel Scans for Soft Errors in Processor Designs","year":"1999","key":"ref8"},{"key":"ref7","article-title":"Soft Error Considerations for DSM CMOS Circuit Applications","author":"cohen","year":"1999","journal-title":"AMD Intel Compaq"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/225871.225877"},{"journal-title":"Road Vehicles-Functional Safety","year":"2011","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/92.311639"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-1453-0_9"},{"journal-title":"miniMIPS Overview","year":"2009","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2007.4449490"}],"event":{"name":"2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST)","start":{"date-parts":[[2017,5,4]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,5,6]]}},"container-title":["2017 6th International Conference on Modern Circuits and Systems Technologies (MOCAST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7934471\/7937608\/07937615.pdf?arnumber=7937615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,25]],"date-time":"2019-09-25T11:40:33Z","timestamp":1569411633000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7937615\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/mocast.2017.7937615","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}