{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T17:35:03Z","timestamp":1732037703240,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/mocast.2018.8376595","type":"proceedings-article","created":{"date-parts":[[2018,6,11]],"date-time":"2018-06-11T23:29:45Z","timestamp":1528759785000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Elements for upset hardened associative memories"],"prefix":"10.1109","author":[{"given":"Yury V.","family":"Katunin","sequence":"first","affiliation":[]},{"given":"Vladimir Ya.","family":"Stenin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/23.556880"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1134\/S1063739715060074"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"419","DOI":"10.1134\/S1063739716050085","article-title":"Upset-Resilient RAM on STG DICE Memory Elements with the Spaced Transistors into Two Groups","volume":"45","author":"ya","year":"2016","journal-title":"Russian Microelectronics"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1134\/S1063739718010031"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1007\/978-1-4419-0931-2"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TC.2013.90"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ICECS.2012.6463629"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/IOLTS.2015.7229860"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1145\/1146909.1147106"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1134\/S1063739714020061"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TNS.2011.2123918"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MOCAST.2017.7937632"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/JSSC.2005.864128"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1134\/S1063739715040095"}],"event":{"name":"2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST)","start":{"date-parts":[[2018,5,7]]},"location":"Thessaloniki","end":{"date-parts":[[2018,5,9]]}},"container-title":["2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8370368\/8376555\/08376595.pdf?arnumber=8376595","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T05:41:53Z","timestamp":1643175713000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8376595\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/mocast.2018.8376595","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}