{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T16:35:50Z","timestamp":1743266150109},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/mocast.2018.8376639","type":"proceedings-article","created":{"date-parts":[[2018,6,11]],"date-time":"2018-06-11T19:29:45Z","timestamp":1528745385000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["A low power, offset compensated, CMOS only bandgap reference in 22 nm FD-SOI technology"],"prefix":"10.1109","author":[{"given":"Prajith Kumar","family":"Poongodan","sequence":"first","affiliation":[{"name":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"}]},{"given":"Pragoti Pran","family":"Bora","sequence":"additional","affiliation":[{"name":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"}]},{"given":"David","family":"Borggreve","sequence":"additional","affiliation":[{"name":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"}]},{"given":"Frank","family":"Vanselow","sequence":"additional","affiliation":[{"name":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"}]},{"given":"Linus","family":"Maurer","sequence":"additional","affiliation":[{"name":"Universit\u00e4t der Bundeswehr, Munich, Germany"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052730"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.772409"},{"key":"ref10","article-title":"A sub-IV bandgap voltage reference in 32nm FinFET technology","author":"annema","year":"2009","journal-title":"IEEE International Solid State Circuits Conference"},{"key":"ref6","article-title":"22nm FDSOI Technology for Emerging Mobile","author":"carter","year":"2017","journal-title":"Internet-of-Things and RF Applications IEEE International Electron Devices Meeting"},{"key":"ref11","doi-asserted-by":"crossref","DOI":"10.1109\/ISCAS.2017.8050747","article-title":"Utra miniature offset bandgap reference with ±0.534 inaccuracy from ?10°C to +110°C","author":"melnik","year":"2017","journal-title":"IEEE International Symposium on Circuits and Systems (ISCAS)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.535416"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2017.52"},{"journal-title":"CMOS Circuit Design Layout and Simulation","year":"2006","author":"baker","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2017.8292033"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594470"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672187"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.760378"}],"event":{"name":"2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST)","start":{"date-parts":[[2018,5,7]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2018,5,9]]}},"container-title":["2018 7th International Conference on Modern Circuits and Systems Technologies (MOCAST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8370368\/8376555\/08376639.pdf?arnumber=8376639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T00:17:23Z","timestamp":1643156243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8376639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/mocast.2018.8376639","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}