{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T10:22:38Z","timestamp":1730283758848,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/mocast.2019.8741913","type":"proceedings-article","created":{"date-parts":[[2019,6,21]],"date-time":"2019-06-21T03:17:13Z","timestamp":1561087033000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Electrical Impedance Tomography Image Reconstruction: Impact of Hardware Noise and Errors"],"prefix":"10.1109","author":[{"given":"Christos","family":"Dimas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nikolaos","family":"Uzunoglu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul P.","family":"Sotiriadis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/26\/2\/017"},{"journal-title":"Image reconstruction algorithms for soft-field tomography","year":"2002","author":"polydorides","key":"ref3"},{"key":"ref6","article-title":"Integrating Circuit Simulation with EIT FEM Models","author":"boyle","year":"2018","journal-title":"19th International Conference of Biomedical Applications of Electrical Impedance Tomography"},{"key":"ref5","article-title":"Fast detection and data compensationfor electrodes disconnection in long-termmonitoring of dynamic brain Electrical Impedance Tomography","volume":"16","author":"zhang","year":"2017","journal-title":"Biomedical Engineering"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MOCAST.2018.8376604"},{"journal-title":"Resistor Networks and Finite Element Models","year":"2011","author":"al-humaidi","key":"ref7"},{"journal-title":"Non-Invasive hemodynamic monitoring by Electrical Impedance Tomography","year":"2017","author":"proenca","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-73841-1_85"},{"journal-title":"Miniaturization and Distinguishability Limits of Electrical Impedance Tomography for Biomedical Application","year":"2011","author":"gaggero","key":"ref1"}],"event":{"name":"2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST)","start":{"date-parts":[[2019,5,13]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2019,5,15]]}},"container-title":["2019 8th International Conference on Modern Circuits and Systems Technologies (MOCAST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8732971\/8741537\/08741913.pdf?arnumber=8741913","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:26:15Z","timestamp":1658262375000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8741913\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/mocast.2019.8741913","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}