{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T12:29:36Z","timestamp":1764937776351},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T00:00:00Z","timestamp":1719360000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T00:00:00Z","timestamp":1719360000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,26]]},"DOI":"10.1109\/mocast61810.2024.10615504","type":"proceedings-article","created":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T17:25:21Z","timestamp":1722965121000},"page":"01-04","source":"Crossref","is-referenced-by-count":2,"title":["Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation"],"prefix":"10.1109","author":[{"given":"Vassilios D.","family":"Vassios","sequence":"first","affiliation":[{"name":"International Hellenic University,Department of Information and Electronic Engineering,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Argyrios.T.","family":"Hatzopoulos","sequence":"additional","affiliation":[{"name":"International Hellenic University,Department of Information and Electronic Engineering,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ioannis G.","family":"Intzes","sequence":"additional","affiliation":[{"name":"International Hellenic University,Department of Information and Electronic Engineering,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitrios K.","family":"Papakostas","sequence":"additional","affiliation":[{"name":"International Hellenic University,Department of Information and Electronic Engineering,Thessaloniki,Greece"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Methods of testing analog and mixed signal using dynamic element matching for source linearization","year":"2009","author":"Olleta","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/b117406"},{"volume-title":"An Introduction to Mixed-Signal IC Test and Measurements","year":"2001","author":"Burns","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:19970870"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1998.679838"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098355"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/el:19940088"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.1999.766127"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/iddq.1998.730731"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.924932"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2017.7995206"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115550"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470621"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/782\/3\/032096"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084665"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS48691.2020.9107570"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-014-0373-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2157734"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-016-0265-z"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.aej.2023.06.090"},{"key":"ref21","first-page":"14","article-title":"A Novel Approach on Fault Detection of Analog and Mixed Signal Circuits by monitoring the fluctuation of the Supply Current","volume-title":"6th International Workshop on Microsystems Alexander Campus, International Hellenic University","author":"Vassios","year":"2021"}],"event":{"name":"2024 13th International Conference on Modern Circuits and Systems Technologies (MOCAST)","start":{"date-parts":[[2024,6,26]]},"location":"Sofia, Bulgaria","end":{"date-parts":[[2024,6,28]]}},"container-title":["2024 13th International Conference on Modern Circuits and Systems Technologies (MOCAST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10615233\/10615286\/10615504.pdf?arnumber=10615504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T05:29:32Z","timestamp":1723008572000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10615504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,26]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/mocast61810.2024.10615504","relation":{},"subject":[],"published":{"date-parts":[[2024,6,26]]}}}