{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,3]],"date-time":"2026-01-03T06:47:56Z","timestamp":1767422876475},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2018,7,1]],"date-time":"2018-07-01T00:00:00Z","timestamp":1530403200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,7,1]],"date-time":"2018-07-01T00:00:00Z","timestamp":1530403200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,7,1]],"date-time":"2018-07-01T00:00:00Z","timestamp":1530403200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Softw."],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/ms.2018.2801541","type":"journal-article","created":{"date-parts":[[2018,7,6]],"date-time":"2018-07-06T18:45:22Z","timestamp":1530902722000},"page":"62-69","source":"Crossref","is-referenced-by-count":20,"title":["What We Know about Testing Embedded Software"],"prefix":"10.1109","volume":"35","author":[{"given":"Vahid","family":"Garousi","sequence":"first","affiliation":[{"name":"Wageningen University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Felderer","sequence":"additional","affiliation":[{"name":"University of Innsbruck"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cagri Murat","family":"Karapicak","sequence":"additional","affiliation":[{"name":"KUASOFT A. &#x15E;."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ugur","family":"Yilmaz","sequence":"additional","affiliation":[{"name":"ASELSAN A. &#x15E;."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2014.01.010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.06.009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-69698-5_9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2017.34"},{"key":"ref14","author":"reyes","year":"2014","journal-title":"Virtual Hardware in the Loop (vHIL) Earlier and Better Testing for Automotive Applications"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2017.3641116"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1016\/bs.adcom.2015.11.005","article-title":"On Testing Embedded Software","volume":"101","author":"banerjee","year":"2016","journal-title":"Advances in Computers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2009.118"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2008.105"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2009.145"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.03.007"},{"key":"ref7","author":"kitchenham","year":"2007","journal-title":"Guidelines for Performing Systematic Literature Reviews in Software Engineering"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786809"},{"key":"ref1","author":"tang","year":"0","journal-title":"On the Worthiness of Software Engineering Research"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809163"}],"container-title":["IEEE Software"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/52\/8405616\/08405633.pdf?arnumber=8405633","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,4]],"date-time":"2022-05-04T20:02:16Z","timestamp":1651694536000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8405633\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":15,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/ms.2018.2801541","relation":{},"ISSN":["0740-7459","1937-4194"],"issn-type":[{"value":"0740-7459","type":"print"},{"value":"1937-4194","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,7]]}}}