{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T12:20:11Z","timestamp":1780489211507,"version":"3.54.1"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100009002","name":"Ministry of Education and Science","doi-asserted-by":"publisher","award":["DWD\/5\/0178\/2021"],"award-info":[{"award-number":["DWD\/5\/0178\/2021"]}],"id":[{"id":"10.13039\/100009002","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Softw."],"published-print":{"date-parts":[[2025,5]]},"DOI":"10.1109\/ms.2024.3505544","type":"journal-article","created":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T18:50:10Z","timestamp":1732647010000},"page":"125-132","source":"Crossref","is-referenced-by-count":3,"title":["Interpretability\/Explainability Applied to Machine Learning Software Defect Prediction: An Industrial Perspective"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3532-3876","authenticated-orcid":false,"given":"Szymon","family":"Stradowski","sequence":"first","affiliation":[{"name":"Wroclaw University of Science and Technology, Wroclaw, Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3907-3357","authenticated-orcid":false,"given":"Lech","family":"Madeyski","sequence":"additional","affiliation":[{"name":"Wroclaw University of Technology, Wroclaw, Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ms.2017.3641116"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2023.107192"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ms.2016.156"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ms.2017.3571562"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-019-0048-x"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2870052"},{"key":"ref7","first-page":"53","article-title":"Explainable software analytics","volume-title":"Proc. 40th Int. Conf. Softw. Eng. (ICSE)","author":"Dam","year":"2018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASE56229.2023.00026"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.5334\/jeps.aq"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASE51524.2021.9678580"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8080832"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2020.2982385"},{"key":"ref13","volume-title":"Predicting test failures induced by software defects: A lightweight alternative to software defect prediction and its industrial application","author":"Madeyski","year":"2024"},{"key":"ref14","volume-title":"The Six Sigma Handbook: A Complete Guide for Green Belts, Black Belts, and Managers at All Levels","author":"Pyzdek","year":"2017"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEMC.2004.1407508"}],"container-title":["IEEE Software"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/52\/10952912\/10767722.pdf?arnumber=10767722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,8]],"date-time":"2025-04-08T17:53:53Z","timestamp":1744134833000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10767722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5]]},"references-count":15,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/ms.2024.3505544","relation":{},"ISSN":["0740-7459","1937-4194"],"issn-type":[{"value":"0740-7459","type":"print"},{"value":"1937-4194","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,5]]}}}