{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T11:18:35Z","timestamp":1783163915517,"version":"3.54.6"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Softw."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/ms.2025.3559194","type":"journal-article","created":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T17:57:03Z","timestamp":1749059823000},"page":"25-33","source":"Crossref","is-referenced-by-count":5,"title":["Next-Generation Software Testing: AI-Powered Test Automation"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3928-5408","authenticated-orcid":false,"given":"Filippo","family":"Ricca","sequence":"first","affiliation":[{"name":"University of Genova, Genova, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Boni","family":"Garc\u00eda","sequence":"additional","affiliation":[{"name":"Universidad Carlos III de Madrid, Madrid, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michel","family":"Nass","sequence":"additional","affiliation":[{"name":"Blekinge Institute of Technology, Karlskrona, Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mark","family":"Harman","sequence":"additional","affiliation":[{"name":"University College, London, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3422622"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/icse-fose59343.2023.00008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3643661.3643953"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3616372"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/icse-fose59343.2023.00009"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ojcs.2023.3300321"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3661167.3661192"},{"key":"ref8","article-title":"A multi-year grey literature review on ai-assisted test automation","author":"Ricca","year":"2024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/icstw52544.2021.00051"},{"key":"ref10","volume-title":"State of testing report 2024","year":"2024"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1257\/pandp.20181019"},{"key":"ref12","volume-title":"World quality report 20232024","year":"2023"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/aitest.2019.000-3"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/mc.2023.3306998"}],"container-title":["IEEE Software"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/52\/11024032\/11024091.pdf?arnumber=11024091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T17:37:19Z","timestamp":1749145039000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11024091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":14,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/ms.2025.3559194","relation":{},"ISSN":["0740-7459","1937-4194"],"issn-type":[{"value":"0740-7459","type":"print"},{"value":"1937-4194","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}