{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,2]],"date-time":"2026-05-02T15:11:21Z","timestamp":1777734681826,"version":"3.51.4"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Softw."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/ms.2025.3621625","type":"journal-article","created":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T17:38:02Z","timestamp":1760636282000},"page":"48-56","source":"Crossref","is-referenced-by-count":1,"title":["What Inputs Drive Effective Large Language Model-Based Unit Test Generation?"],"prefix":"10.1109","volume":"43","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-4556-7149","authenticated-orcid":false,"given":"Saarang","family":"Agarwal","sequence":"first","affiliation":[{"name":"University of Waterloo, Waterloo, ON, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1529-3216","authenticated-orcid":false,"given":"Pengyu","family":"Nie","sequence":"additional","affiliation":[{"name":"University of Waterloo, Waterloo, ON, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4533-4728","authenticated-orcid":false,"given":"Meiyappan","family":"Nagappan","sequence":"additional","affiliation":[{"name":"University of Waterloo, Waterloo, ON, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2016.03.003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2023.3334955"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/icse48619.2023.00085"},{"key":"ref4","article-title":"CoverUp: Coverage-guided LLM-based test generation","author":"Pizzorno","year":"2024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568271"},{"key":"ref6","volume-title":"Writing tests with GitHub Copilot"},{"key":"ref7","article-title":"Best practices for writing unit tests","year":"2023","journal-title":"Qodo"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3691620.3695527"},{"key":"ref9","article-title":"Measuring the influence of incorrect code on test generation","author":"Huang","year":"2025"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/stv.430"}],"container-title":["IEEE Software"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/52\/11316879\/11205490.pdf?arnumber=11205490","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T18:38:35Z","timestamp":1767119915000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11205490\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":10,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/ms.2025.3621625","relation":{},"ISSN":["0740-7459","1937-4194"],"issn-type":[{"value":"0740-7459","type":"print"},{"value":"1937-4194","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}