{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:24:44Z","timestamp":1725571484950},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,7]]},"DOI":"10.1109\/mse.2009.5270836","type":"proceedings-article","created":{"date-parts":[[2009,9,30]],"date-time":"2009-09-30T14:35:31Z","timestamp":1254321331000},"page":"37-40","source":"Crossref","is-referenced-by-count":0,"title":["A mixed TCAD\/Electrical simulation laboratory to open up the microelectronics teaching"],"prefix":"10.1109","author":[{"given":"Jean-Marc","family":"Galliere","sequence":"first","affiliation":[]},{"given":"Jerome","family":"Boch","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"SPECTRE","year":"0","key":"3"},{"year":"0","key":"2"},{"journal-title":"ModelSim","year":"0","key":"1"},{"key":"7","article-title":"integrating professionnal tcad simulation tools in undergraduate semiconductor device courses","author":"kenrow","year":"0","journal-title":"Proceeding of the 2004 American Society for Engineering Educational Annual Conference"},{"journal-title":"Sentaurus","year":"0","key":"6"},{"journal-title":"SILVACO","year":"0","key":"5"},{"journal-title":"Eldo http","year":"0","key":"4"},{"journal-title":"Test de Circuits et de Syste?mes Inte?gre?s","year":"2004","author":"landrault","key":"9"},{"key":"8","first-page":"43","article-title":"extensive cmos and electrical simulation learning","author":"galliere","year":"2006","journal-title":"6th International Workshop on Microelectronics Education"}],"event":{"name":"2009 IEEE International Conference on Microelectronic Systems Education (MSE)","start":{"date-parts":[[2009,7,25]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2009,7,27]]}},"container-title":["2009 IEEE International Conference on Microelectronic Systems Education"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5234370\/5270809\/05270836.pdf?arnumber=5270836","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T18:37:30Z","timestamp":1489862250000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5270836\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,7]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/mse.2009.5270836","relation":{},"subject":[],"published":{"date-parts":[[2009,7]]}}}