{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T10:23:23Z","timestamp":1730283803413,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/mse.2015.7160006","type":"proceedings-article","created":{"date-parts":[[2015,7,16]],"date-time":"2015-07-16T22:03:05Z","timestamp":1437084185000},"page":"13-16","source":"Crossref","is-referenced-by-count":0,"title":["Using industry-grade test equipment in a digital test and product engineering lab course"],"prefix":"10.1109","author":[{"given":"Christopher","family":"Miller","sequence":"first","affiliation":[]},{"given":"Tina A.","family":"Hudson","sequence":"additional","affiliation":[]},{"given":"Shannon","family":"Sipes","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"1245","article-title":"Academic network for microelectronic test education","volume":"23","author":"novak","year":"2007"},{"key":"ref3","first-page":"34","article-title":"Wanted: Test engineers!","volume":"42","author":"konidaris","year":"2003","journal-title":"Evaluation Engineering"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TE.2010.2040738"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2006.58"},{"journal-title":"An Introduction to Mixed-Signal Test and Measurement","year":"2001","author":"burns","key":"ref2"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"ref1"}],"event":{"name":"2015 IEEE International Conference on Microelectronics Systems Education (MSE)","start":{"date-parts":[[2015,5,20]]},"location":"Pittsburgh, PA, USA","end":{"date-parts":[[2015,5,21]]}},"container-title":["2015 IEEE International Conference on Microelectronics Systems Education (MSE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7152705\/7159996\/07160006.pdf?arnumber=7160006","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:02:19Z","timestamp":1490385739000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7160006\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/mse.2015.7160006","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}