{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,23]],"date-time":"2025-10-23T11:12:42Z","timestamp":1761217962575,"version":"3.28.0"},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/mse.2017.7945085","type":"proceedings-article","created":{"date-parts":[[2017,6,12]],"date-time":"2017-06-12T20:43:45Z","timestamp":1497300225000},"page":"55-58","source":"Crossref","is-referenced-by-count":3,"title":["On-die thermal evaluation system"],"prefix":"10.1109","author":[{"given":"Suresh","family":"Parameswaran","sequence":"first","affiliation":[]},{"given":"Saravanan","family":"Balakrishnan","sequence":"additional","affiliation":[]},{"given":"Boon","family":"Ang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Design of Analog CMOS Integrated Circuits","year":"2011","author":"razavi","key":"ref3"},{"key":"ref2","article-title":"PVT Insensitive Reference Current Generation","volume":"ii","author":"vishwasrao shinde","year":"0","journal-title":"Proceedings of the International MultiConference of Engineers and Computer Scientists"},{"key":"ref1","first-page":"76","article-title":"Ring Oscillator Based CMOS Temperature Sensor Design","volume":"1","author":"suman","year":"2012","journal-title":"International Journal of Scientific & Technology Research"}],"event":{"name":"2017 IEEE International Conference on Microelectronic Systems Education (MSE)","start":{"date-parts":[[2017,5,11]]},"location":"Lake Louise, AB, Canada","end":{"date-parts":[[2017,5,12]]}},"container-title":["2017 IEEE International Conference on Microelectronic Systems Education (MSE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7938014\/7945063\/07945085.pdf?arnumber=7945085","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T22:55:18Z","timestamp":1497912918000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7945085\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/mse.2017.7945085","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}