{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T17:46:20Z","timestamp":1773078380046,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/mtdt.2002.1029762","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T18:14:31Z","timestamp":1056564871000},"page":"44-48","source":"Crossref","is-referenced-by-count":2,"title":["Fault tolerant insertion and verification: a case study"],"prefix":"10.1109","author":[{"given":"A.","family":"Manzone","sequence":"first","affiliation":[]},{"given":"D.","family":"De Costantini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","year":"1998","journal-title":"Rev 1 3"},{"key":"ref3","article-title":"Automatic Fault-tolerant Insertion Tool User Manual","year":"0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-40891-6_3"},{"key":"ref5","year":"0","journal-title":"Beta release of Automatic Fault Injection Tool and User Manual"},{"key":"ref2","article-title":"Full Specification of the Faul Tolerant Toolset and Design Methodology","year":"0"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1109\/VTEST.1999.766651","article-title":"Time Redundancy Based Soft Error Tolerance to Rescue Nanometer Tecnologies","author":"nikoladis","year":"1999","journal-title":"IEEE 17 VLSI Test Symposium"}],"event":{"name":"Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing","location":"Isle of Bendor, France","acronym":"MTDT-02"},"container-title":["Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8004\/22126\/01029762.pdf?arnumber=1029762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T18:42:31Z","timestamp":1497552151000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1029762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/mtdt.2002.1029762","relation":{},"subject":[]}}