{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:25:45Z","timestamp":1725503145867},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/mtdt.2002.1029763","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T22:14:31Z","timestamp":1056579271000},"page":"49-53","source":"Crossref","is-referenced-by-count":0,"title":["Design and implementation of a self-checking scheme for railway trackside systems"],"prefix":"10.1109","author":[{"given":"L.","family":"Schiano","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Metra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Marino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510850"},{"journal-title":"Fault Tolerant Computing Theory and Techniques","year":"1986","author":"pradhan","key":"ref3"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.277640"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-6527-4_13"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675139"},{"journal-title":"Self-Checking and Fault-Tolerant Digital Design","year":"1990","author":"lala","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/54.735926"},{"key":"ref7","first-page":"587","article-title":"On-Line Testing Scheme for Clocks' Faults","author":"metra","year":"1997","journal-title":"Proc of IEEE Int Test Conf"},{"key":"ref2","first-page":"878","article-title":"Design of dynamically checked computers","author":"carter","year":"1968","journal-title":"Proc IFIP-68"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966718"},{"journal-title":"Design of self-checking digital network using coding techniques Tech Report R-527","year":"1971","author":"anderson","key":"ref1"}],"event":{"name":"Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing","acronym":"MTDT-02","location":"Isle of Bendor, France"},"container-title":["Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8004\/22126\/01029763.pdf?arnumber=1029763","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T21:37:17Z","timestamp":1489181837000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1029763\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/mtdt.2002.1029763","relation":{},"subject":[]}}