{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:48:06Z","timestamp":1725472086514},"reference-count":8,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/mtdt.2002.1029774","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T22:14:31Z","timestamp":1056579271000},"page":"137-142","source":"Crossref","is-referenced-by-count":1,"title":["An automated design methodology for EEPROM cell (ADE)"],"prefix":"10.1109","author":[{"given":"J.M.","family":"Portal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Forli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Aziza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Nee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/16.8801"},{"journal-title":"Nonvolatile Semiconductor Memory Technology","year":"1998","author":"brown","key":"ref3"},{"key":"ref6","article-title":"MOS Model 9","author":"velghe","year":"1994","journal-title":"Unclassified Report NL-UR 003\/94 Philips Electronics N V"},{"journal-title":"Eldo User's Manual","year":"1998","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2307\/2346327"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010345"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.622505"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1657043"}],"event":{"name":"Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing","acronym":"MTDT-02","location":"Isle of Bendor, France"},"container-title":["Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8004\/22126\/01029774.pdf?arnumber=1029774","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T21:06:55Z","timestamp":1489180015000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1029774\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/mtdt.2002.1029774","relation":{},"subject":[]}}