{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:48:28Z","timestamp":1725504508296},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/mtdt.2003.1222364","type":"proceedings-article","created":{"date-parts":[[2004,3,22]],"date-time":"2004-03-22T09:34:28Z","timestamp":1079948068000},"page":"72-77","source":"Crossref","is-referenced-by-count":5,"title":["Applying defect-based test to embedded memories in a COT model"],"prefix":"10.1109","author":[{"given":"R.","family":"Aitken","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041757"},{"key":"ref3","article-title":"High Performance Memory Testing: Design Principles","author":"adams","year":"2002","journal-title":"Fault Modeling and Self-Test"},{"key":"ref10","article-title":"Today's test choices: anticipate, adapt, partner or perish","author":"nigh","year":"2001","journal-title":"Invited address ITC"},{"key":"ref6","first-page":"552","article-title":"Inductive Contamination Analysis With SRAM Application","author":"khare","year":"1995"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966650"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207820"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref7","first-page":"929","article-title":"Functional and IDDQ Testing on a Static RAM","author":"meershoek","year":"1990","journal-title":"ITC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894248"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743137"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"ref1"}],"event":{"name":"Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing","acronym":"MTDT-03","location":"San Jose, CA, USA"},"container-title":["Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8664\/27457\/01222364.pdf?arnumber=1222364","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T14:03:18Z","timestamp":1489413798000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1222364\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/mtdt.2003.1222364","relation":{},"subject":[]}}