{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T20:02:33Z","timestamp":1725480153433},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/mtv.2003.1250269","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T16:18:03Z","timestamp":1083860283000},"page":"95-100","source":"Crossref","is-referenced-by-count":0,"title":["A robust and scalable technique for the constraints solving problem in high-level verification"],"prefix":"10.1109","author":[{"given":"M.A.","family":"Iyer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1112","article-title":"High Time for High-Level ATP G. Panel Position Statement","author":"iyer","year":"1999","journal-title":"Proceedings of The International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270852"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.310903"},{"year":"2002","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810715"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1147\/sj.413.0386"},{"journal-title":"Writing Testbenches Functional Verification of HDL Models","year":"2000","author":"bergeron","key":"ref3"},{"key":"ref6","first-page":"245","article-title":"Constraint Solving for Test Case Generation","author":"chandra","year":"1992","journal-title":"Proceedings of International Conference on Computer Design"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676819"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675757"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/92.386220"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/sj.304.0527"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1995","author":"abramovici","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855289"}],"event":{"name":"4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions","acronym":"MTV-03","location":"Austin, TX, USA"},"container-title":["Proceedings. 4th International Workshop on Microprocessor Test and Verification - Common Challenges and Solutions"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8841\/27975\/01250269.pdf?arnumber=1250269","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:15:24Z","timestamp":1489443324000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250269\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/mtv.2003.1250269","relation":{},"subject":[]}}