{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T10:26:45Z","timestamp":1730284005051,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/mva.2015.7153170","type":"proceedings-article","created":{"date-parts":[[2015,7,13]],"date-time":"2015-07-13T17:14:09Z","timestamp":1436807649000},"page":"214-217","source":"Crossref","is-referenced-by-count":9,"title":["OLED panel defect detection using local inlier-outlier ratios and modified LBP"],"prefix":"10.1109","author":[{"given":"Vishwanath A.","family":"Sindagi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sumit","family":"Srivastava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1299\/jamdsm.2.441"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/1\/015507"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1155\/2008\/783898"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2006.03.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2002.1017623"},{"key":"ref5","first-page":"458946","article-title":"Automatic defect inspection of patterned TFT-LCD panels using 1-D Fourier reconstruction and Wavelet decomposition","volume":"43","author":"tsai","year":"0","journal-title":"International Journal of Production Research"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/130385.130401"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1930.896476"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2258242"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/00207540410001716480"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2011.02.002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00207540412331285832"}],"event":{"name":"2015 14th IAPR International Conference on Machine Vision Applications (MVA)","start":{"date-parts":[[2015,5,18]]},"location":"Tokyo, Japan","end":{"date-parts":[[2015,5,22]]}},"container-title":["2015 14th IAPR International Conference on Machine Vision Applications (MVA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7140197\/7153114\/07153170.pdf?arnumber=7153170","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:03:50Z","timestamp":1490375030000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7153170\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/mva.2015.7153170","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}