{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:03:43Z","timestamp":1761581023204,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/mwscas.2012.6291988","type":"proceedings-article","created":{"date-parts":[[2012,9,10]],"date-time":"2012-09-10T15:47:44Z","timestamp":1347292064000},"page":"186-189","source":"Crossref","is-referenced-by-count":3,"title":["CNTFET SRAM cell with tolerance to removed metallic CNTs"],"prefix":"10.1109","author":[{"given":"Zhe","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Jose G.","family":"Delgado-Frias","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2003.1221147"},{"year":"0","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/19\/29\/295202"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2006.306040"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2011.6144323"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.901882"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.818338"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL.2002.1003155"},{"key":"9","doi-asserted-by":"crossref","first-page":"974","DOI":"10.1126\/science.1133781","article-title":"Selective Etching of Metallic Carbon Nanotubes by Gas-phase Reaction","volume":"314","author":"zhang","year":"2006","journal-title":"Science"},{"key":"8","first-page":"182","article-title":"A Metallic-CNT-Tolerant Carbon Nanotube Technology Using Asymmetrically-Correlated CNTs (ACCNT)","author":"lin","year":"2009","journal-title":"2009 Symposium on VLSI Technology"}],"event":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2012,8,5]]},"location":"Boise, ID, USA","end":{"date-parts":[[2012,8,8]]}},"container-title":["2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6276898\/6291930\/06291988.pdf?arnumber=6291988","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T19:59:06Z","timestamp":1497988746000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6291988\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2012.6291988","relation":{},"subject":[],"published":{"date-parts":[[2012,8]]}}}