{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T06:01:54Z","timestamp":1759384914762},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/mwscas.2013.6674736","type":"proceedings-article","created":{"date-parts":[[2013,12,4]],"date-time":"2013-12-04T21:14:10Z","timestamp":1386191650000},"page":"665-668","source":"Crossref","is-referenced-by-count":2,"title":["A background gain- calibration technique for low voltage pipelined ADCs based on nonlinear interpolation"],"prefix":"10.1109","author":[{"given":"Li","family":"Ding","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sai-Weng","family":"Sin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seng-Pan","family":"U","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.P.","family":"Martins","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.835826"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914260"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2011.6055421"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836230"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2024809"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/82.826744"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/82.554434"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821306"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856291"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.816921"}],"event":{"name":"2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2013,8,4]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2013,8,7]]}},"container-title":["2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6653322\/6674559\/06674736.pdf?arnumber=6674736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T23:20:31Z","timestamp":1490224831000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6674736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2013.6674736","relation":{},"subject":[],"published":{"date-parts":[[2013,8]]}}}