{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,15]],"date-time":"2025-11-15T03:54:23Z","timestamp":1763178863600,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,8]]},"DOI":"10.1109\/mwscas.2014.6908338","type":"proceedings-article","created":{"date-parts":[[2014,9,30]],"date-time":"2014-09-30T10:54:51Z","timestamp":1412074491000},"page":"5-8","source":"Crossref","is-referenced-by-count":3,"title":["A novel self-calibration scheme for 12-bit 50MS\/s SAR ADC"],"prefix":"10.1109","author":[{"given":"In-Seok","family":"Jung","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong-Bin","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"2","first-page":"1","article-title":"Accurate and efficient on-chip spectral analysis for built-in testing and calibration approaches","author":"chauhan","year":"2013","journal-title":"Very Large Scale Integration (VLSI) Systems IEEE Transactions on"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/4.881204"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060145"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.848021"},{"key":"6","first-page":"982","article-title":"Modeling of capacitor array mismatch effect in embedded cmos cr sar adc","volume":"2","author":"lin","year":"0","journal-title":"ASIC 2005 ASICON 2005 6th International Conference On"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052250"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2042254"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746503"},{"key":"8","volume":"2","author":"tsividis","year":"1999","journal-title":"Operation and Modeling of the MOS Transistor"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040116"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2012329"}],"event":{"name":"2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2014,8,3]]},"location":"College Station, TX, USA","end":{"date-parts":[[2014,8,6]]}},"container-title":["2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6900043\/6908326\/06908338.pdf?arnumber=6908338","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:23:35Z","timestamp":1490282615000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6908338\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,8]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2014.6908338","relation":{},"subject":[],"published":{"date-parts":[[2014,8]]}}}