{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:40:57Z","timestamp":1725536457175},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/mwscas.2017.8052853","type":"proceedings-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T16:21:31Z","timestamp":1508862091000},"page":"33-36","source":"Crossref","is-referenced-by-count":0,"title":["Compact and voltage-scalable sensor for accurate thermal sensing in dynamic thermal management"],"prefix":"10.1109","author":[{"given":"Teng","family":"Yang","sequence":"first","affiliation":[]},{"given":"Pavan K.","family":"Chundi","sequence":"additional","affiliation":[]},{"given":"Seongjong","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Eren","family":"Kursun","sequence":"additional","affiliation":[]},{"given":"Martha","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Peter R.","family":"Kinget","sequence":"additional","affiliation":[]},{"given":"Mingoo","family":"Seok","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280039"},{"key":"ref11","first-page":"152","article-title":"A 1.1 V 35 &#x00B5;m x 35 &#x00B5;m thermal sensor with supply voltage sensitivity of 2&#x00B0;C\/l 0%-supply for thermal management on the SX-9 supercomputer","author":"saneyoshi","year":"2008","journal-title":"IEEE Symp VLSI Circuits"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2035553"},{"key":"ref13","first-page":"203","article-title":"A 366kS\/s 400uW 0.0013mm2 Frequency-to-Digital Converter based CMOS temperature sensor using multiphase clock","author":"kim","year":"2009","journal-title":"IEEE Custom Integrated Circuits Conference"},{"key":"ref14","first-page":"222","article-title":"A 0.85V, 600nW All-CMOS Temperature Sensor with an Inaccuracy of &#x00B1;0.4 &#x00B0;C (30?) from ?40&#x00B0;C to 125&#x00B0;C","author":"souri","year":"2014","journal-title":"IEEE Int Solid-State Circuits Conf Dig Tech Papers"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2246254"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2272338"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2476815"},{"key":"ref18","first-page":"488","article-title":"A 4600 &#x00B5;m2 1.5&#x00B0;C (3?) 0.9 kS\/s Thermal-Diffusivity Temperature Sensor with VCO-Based Readout","author":"quan","year":"2015","journal-title":"IEEE Int Solid-State Circuits Conf Dig Tech Papers"},{"key":"ref19","article-title":"A 30.1&#x00B5;m2, < &#x00B1;1.1&#x00B0;C-3?-Error, 0.4-to-1.0V Temperature Sensor basedon Direct Threshold Voltage Sensing for On-Chip Dense Thermal Monitoring","author":"kim","year":"2016","journal-title":"IEEE Custom Integrated Circuits Conference (CICC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2063384.2063454"},{"key":"ref3","article-title":"Dynamic Thermal Management in 3D Multipcore Architecture","author":"coskun","year":"2009","journal-title":"Design Automation & Test in Europe Conference & Exhibition (DATE)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859620"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1400112.1400114"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.1995.524546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2002.995695"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2001.903261"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837291"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2206683"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2187671.2187675"},{"key":"ref21","doi-asserted-by":"crossref","DOI":"10.1109\/ISSCC.2017.7870403","article-title":"A 0.5 VIN 1.44 mA-Class Event-Driven Digital LDO with a Fully Integrated 100pF Output Capacitor","author":"kim","year":"2017","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"}],"event":{"name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2017,8,6]]},"location":"Boston, MA, USA","end":{"date-parts":[[2017,8,9]]}},"container-title":["2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8039346\/8052834\/08052853.pdf?arnumber=8052853","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,4]],"date-time":"2019-10-04T23:16:42Z","timestamp":1570231002000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8052853\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2017.8052853","relation":{},"subject":[],"published":{"date-parts":[[2017,8]]}}}