{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T00:22:04Z","timestamp":1768004524829,"version":"3.49.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/mwscas.2017.8052870","type":"proceedings-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T16:21:31Z","timestamp":1508862091000},"page":"100-103","source":"Crossref","is-referenced-by-count":6,"title":["Ultra-compact sub-10nm logic circuits based on ambipolar SB-FinFETs"],"prefix":"10.1109","author":[{"given":"Talha Furkan","family":"Canan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Savas","family":"Kaya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avinash","family":"Kodi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Xin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ahmed","family":"Louri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.856191"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2016.2542525"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2988233"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.881052"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2914790"},{"key":"ref2","first-page":"16","article-title":"Self-depleted t-gate schottky barrier tunneling fet with low average subthreshold slope and high i on\/i off by gate configuration and barrier modulation","author":"huang","year":"2011","journal-title":"Electron Devices Meeting (IEDM) 2011 IEEE International IEEE"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.871842"}],"event":{"name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","location":"Boston, MA, USA","start":{"date-parts":[[2017,8,6]]},"end":{"date-parts":[[2017,8,9]]}},"container-title":["2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8039346\/8052834\/08052870.pdf?arnumber=8052870","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T17:35:57Z","timestamp":1509125757000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8052870\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2017.8052870","relation":{},"subject":[],"published":{"date-parts":[[2017,8]]}}}