{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T02:06:34Z","timestamp":1725674794309},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/mwscas.2017.8053057","type":"proceedings-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T20:21:31Z","timestamp":1508876491000},"page":"851-854","source":"Crossref","is-referenced-by-count":5,"title":["Parameter identification of a double barrier memristive device"],"prefix":"10.1109","author":[{"given":"Enver","family":"Solan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karlheinz","family":"Ochs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2017.00091"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-011-6264-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1986.13458"},{"journal-title":"An Enhanced Lumped Element Electrical Model of a Double Barrier Memristive Device","year":"2017","author":"solan","key":"ref6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1702682"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/srep35686"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/srep13753"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2016.7869981"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2016.7869980"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2016.7869946"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1976.10092"}],"event":{"name":"2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2017,8,6]]},"location":"Boston, MA, USA","end":{"date-parts":[[2017,8,9]]}},"container-title":["2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8039346\/8052834\/08053057.pdf?arnumber=8053057","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T21:50:04Z","timestamp":1509141004000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8053057\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2017.8053057","relation":{},"subject":[],"published":{"date-parts":[[2017,8]]}}}