{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:45:50Z","timestamp":1725561950246},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,8]]},"DOI":"10.1109\/mwscas.2018.8623886","type":"proceedings-article","created":{"date-parts":[[2019,2,19]],"date-time":"2019-02-19T00:40:24Z","timestamp":1550536824000},"page":"33-36","source":"Crossref","is-referenced-by-count":0,"title":["All Digital Low Power Aging Sensor for Counterfeit Detection in Integrated Circuits"],"prefix":"10.1109","author":[{"given":"Enahoro","family":"Oriero","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Syed Rafay","family":"Hasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.12.013"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282148"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.03.009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763260"},{"key":"ref14","article-title":"CMOS VLSI design: a circuits and systems perspective","author":"weste","year":"2015","journal-title":"Pearson Education India"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2449231"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5430-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2466551"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962099"},{"key":"ref7","article-title":"An On-Chip Technique to Detect Hardware Trojans and Assist Counterfeit Identification","author":"lecomte","year":"2016","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2569581"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140232"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2014.7087599"}],"event":{"name":"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2018,8,5]]},"location":"Windsor, ON, Canada","end":{"date-parts":[[2018,8,8]]}},"container-title":["2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610060\/8623819\/08623886.pdf?arnumber=8623886","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:14:51Z","timestamp":1598224491000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8623886\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2018.8623886","relation":{},"subject":[],"published":{"date-parts":[[2018,8]]}}}