{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T02:26:37Z","timestamp":1725416797433},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,8]]},"DOI":"10.1109\/mwscas.2018.8623959","type":"proceedings-article","created":{"date-parts":[[2019,2,19]],"date-time":"2019-02-19T00:40:24Z","timestamp":1550536824000},"page":"113-116","source":"Crossref","is-referenced-by-count":0,"title":["Excess Bias Voltage Monitoring Circuit"],"prefix":"10.1109","author":[{"given":"Nenad","family":"Lilic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert","family":"Kappel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georg","family":"Roehrer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Horst","family":"Zimmermann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2014.2328440"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2475126"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2755989"},{"key":"ref5","article-title":"Modeling of Breakdown Voltage and Its Temperature Dependence in SAGCM InP\/InGaAs Avalanche Photodiodes","author":"ma","year":"1994","journal-title":"IEEE IEDM"},{"key":"ref8","article-title":"Avalanche Diode Arrangement and Method for Providing a Detection Signal","author":"leonardo","year":"0","journal-title":"World Intellectual Property Organization"},{"journal-title":"Method and Device for Adjusting the Bias Voltage of a SPAD Photodiode","year":"2013","author":"brunel","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2450936"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-44971-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2475355"}],"event":{"name":"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2018,8,5]]},"location":"Windsor, ON, Canada","end":{"date-parts":[[2018,8,8]]}},"container-title":["2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610060\/8623819\/08623959.pdf?arnumber=8623959","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T05:05:26Z","timestamp":1598245526000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8623959\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2018.8623959","relation":{},"subject":[],"published":{"date-parts":[[2018,8]]}}}