{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T14:12:06Z","timestamp":1725459126717},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,8]]},"DOI":"10.1109\/mwscas.2018.8624014","type":"proceedings-article","created":{"date-parts":[[2019,2,28]],"date-time":"2019-02-28T22:19:10Z","timestamp":1551392350000},"page":"845-848","source":"Crossref","is-referenced-by-count":1,"title":["Physically Unclonable Function based on Voltage Divider Arrays in Subthreshold Region"],"prefix":"10.1109","author":[{"given":"Aishwarya Bahudhanam","family":"Venkatasubramaniyan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arindam","family":"Sanyal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008504"},{"key":"ref6","first-page":"158","article-title":"Physically unclonable function for secure key generation with a key error rate of 2E38 in 45nm smart-card chips","author":"karpinskyy","year":"0","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2506641"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008503"},{"key":"ref7","first-page":"1","article-title":"A physically unclonable function with BER¡10–8 for robust chip authentication using oscillator collapse in 40nm CMOS","author":"yang","year":"0","journal-title":"IEEE International Solid-State Circuits Conference-(ISSCC)"},{"key":"ref2","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"Proceedings of the 44th Annual Design Automation Conference"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.11.005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346548"}],"event":{"name":"2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)","start":{"date-parts":[[2018,8,5]]},"location":"Windsor, ON, Canada","end":{"date-parts":[[2018,8,8]]}},"container-title":["2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8610060\/8623819\/08624014.pdf?arnumber=8624014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T01:45:45Z","timestamp":1598233545000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,8]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/mwscas.2018.8624014","relation":{},"subject":[],"published":{"date-parts":[[2018,8]]}}}